Tekninen Dokumentti
Tekniset tiedot
Merkki
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Width
1.7mm
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
Tuotetiedot
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.
Varastotiedot eivät ole tilapäisesti saatavilla.
€ 55,65
€ 0,371 kpl (toimitus kelassa) (ilman ALV)
€ 69,84
€ 0,466 kpl (toimitus kelassa) (Sis ALV:n)
Tuotantopakkaus (Kela)
150
€ 55,65
€ 0,371 kpl (toimitus kelassa) (ilman ALV)
€ 69,84
€ 0,466 kpl (toimitus kelassa) (Sis ALV:n)
Varastotiedot eivät ole tilapäisesti saatavilla.
Tuotantopakkaus (Kela)
150
| Määrä | Yksikköhinta | Per Kela |
|---|---|---|
| 150 - 725 | € 0,371 | € 9,28 |
| 750+ | € 0,329 | € 8,22 |
Tekninen Dokumentti
Tekniset tiedot
Merkki
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Width
1.7mm
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
Tuotetiedot
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.